Model DFP-02
Four Probe Method (Basic)
Resistivity of bulk semiconductors with the four-point Van der Pauw geometry.
Model DFP-02
01 / 04
Overview
4 – Probe resistivity measurement (Basic Model)., Temperature variation of resistance study., Built-in constant current source and Milli-Voltmeter.
Specifications
Technical data
- Model
- DFP-02
- Manufacturer
- SVS Labs
- Category
- Research Instruments
- Geometry
- Four-point linear probe head
- Temperature range
- Ambient to 200 °C
- Operating environment
- 10–40 °C, RH ≤ 80%
Applications
- Spectroscopy and resonance-based research
- Thin-film and bulk-semiconductor characterisation
- Closed-loop control system experiments
Features
- CMM-inspected
- Documented test reports
- Computer interface optional
Quick inquiry
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