Model VDX-01
Van der Pauw Experiment
Sheet-resistance and Hall measurement on irregular thin-film samples.
Model VDX-01
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Overview
Sheet-resistance and Hall measurement on irregular thin-film samples.
Specifications
Technical data
- Model
- VDX-01
- Manufacturer
- SVS Labs
- Category
- Research Instruments
- Operating environment
- 10–40 °C, RH ≤ 80%
Applications
- Spectroscopy and resonance-based research
- Thin-film and bulk-semiconductor characterisation
- Closed-loop control system experiments
Features
- CMM-inspected
- Documented test reports
- Computer interface optional
Quick inquiry
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